Questions? Feedback? powered by Olark live chat software

Submitting. Please wait...

Impact Of Circuit Resistance On The Breakdown Voltage Of Tantalum Chip Capacitors

Download PDF:

Experiments are described in this paper whose results suggest a clear mathematical relationship between total circuit resistance (including the capacitor’s ESR) and the voltage at which a capacitor is likely to break down. Specifically, the relationship defines how much each capacitor’s (not precisely known) breakdown voltage is affected by changes in circuit resistance. Since a factor that strongly influences the reliability of a tantalum capacitor is the ratio of the capacitor’s breakdown voltage to the applied voltage, if the impact of circuit resistance on breakdown voltage can be established, then, at least indirectly, the impact of circuit resistance on reliability can be inferred.

Share this: