The demand for Low-ESR tantalum capacitors has popularized the use of high conductivity conductive polymer counter electrode designs over more established manganese dioxide (MnO2) tantalums. While the reliability of MnO2 tantalums has been well studied, the expected performance of conductive polymer tantalums is less understood. To characterize the reliability of polymer tantalums, accelerated lifetesting utilizing high electric field stress and temperature is performed on multiple test samples. The time-to-failure data is fit to a failure model and the model is then used to predict device reliability under less strenuous conditions. Considering all the data, median life for the test sample at maximum rated conditions was found to exceed 300 years.